STUDY OF STRUCTURAL AND OPTICAL PROPERTIES ZN1-XCRXO (X= 0.00 & 0.02) THIN FILMS DEPOSITED BY SPRAY PYROLYSIS ROUTE
Keywords:
Zn1-xCrxO thin film, XRD pattern, UV-Visible spectraAbstract
Objective: The High quality with low economical cost thin films has become a global need. Zn1-xCrxO (x= 0.00 & 0.02) thin film has been deposited on glass substrate by simple chemical spray pyrolysis route.
Materials and Methods:The structural and optical properties Zn1-xCrxO (x= 0.00 & 0.02) film were studied by using x-ray diffraction (XRD) pattern and UV-Visible spectra. The structural parameters such as lattice constant (a & c), strain and dislocation density was also calculated by analyzing xray diffraction pattern
Results:The entire x-ray diffraction peaks confirm that the Zn1-xCrxO films have polycrystalline nature with hexagonal (wurtzite) crystal structure. The mean crystalline size was determined by Debye-Scherrer formula. The crystallite size was found to be 32nm and 22nm for x=0.00 and x=0.02 respectively. The transmittance spectra reveal that all the films have high transmittance (higher than 80%) in the range of visible and near to the infrared wavelength region. There was decreasing band gap with Cr (x=0.02) doping concentration.
Conclusion: Structural and optical properties reveal that films are of good quality that are suitable for several applications.
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